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Femtosecond-Laser-Ablation Dynamics in Silicon Revealed by Transient Reflectivity Change.
Feng, Tao; Chen, Gong; Han, Hainian; Qiao, Jie.
  • Feng T; Chester F. Carlson Center for Imaging Science, Rochester Institute of Technology, 54 Lomb Memorial Drive, Rochester, NY 14623, USA.
  • Chen G; Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, 390 Qinghe Road, Shanghai 201800, China.
  • Han H; Chester F. Carlson Center for Imaging Science, Rochester Institute of Technology, 54 Lomb Memorial Drive, Rochester, NY 14623, USA.
  • Qiao J; Chester F. Carlson Center for Imaging Science, Rochester Institute of Technology, 54 Lomb Memorial Drive, Rochester, NY 14623, USA.
Micromachines (Basel) ; 13(1)2021 Dec 23.
Article en En | MEDLINE | ID: mdl-35056180
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Texto completo: 1 Banco de datos: MEDLINE Tipo de estudio: Prognostic_studies Idioma: En Año: 2021 Tipo del documento: Article
Texto completo
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XML
PubMed Links
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Texto completo: 1 Banco de datos: MEDLINE Tipo de estudio: Prognostic_studies Idioma: En Año: 2021 Tipo del documento: Article