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Nonvolatile High-Speed Switching Zn-O-N Thin-Film Transistors with a Bilayer Structure.
Kim, Hyoung-Do; Naqi, Muhammad; Jang, Seong Cheol; Park, Ji-Min; Park, Yun Chang; Park, Kyung; Nahm, Ho-Hyun; Kim, Sunkook; Kim, Hyun-Suk.
  • Kim HD; Department of Materials Science and Engineering, Chungnam National University, Daejeon 34134, Republic of Korea.
  • Naqi M; School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon 16419, Republic of Korea.
  • Jang SC; Department of Materials Science and Engineering, Chungnam National University, Daejeon 34134, Republic of Korea.
  • Park JM; Department of Materials Science and Engineering, Chungnam National University, Daejeon 34134, Republic of Korea.
  • Park YC; National Nano Fab Center, Daejeon 34141, Republic of Korea.
  • Park K; Semiconductor Process Laboratory, WONIK IPS, Gyeonggi-do 17709, Republic of Korea.
  • Nahm HH; Department of Physics, Korea Advanced Institute of Science and Technology, Daejeon 34141, Republic of Korea.
  • Kim S; School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon 16419, Republic of Korea.
  • Kim HS; Department of Materials Science and Engineering, Chungnam National University, Daejeon 34134, Republic of Korea.
ACS Appl Mater Interfaces ; 14(11): 13490-13498, 2022 Mar 23.
Article en En | MEDLINE | ID: mdl-35258276

Texto completo: 1 Banco de datos: MEDLINE Idioma: En Año: 2022 Tipo del documento: Article

Texto completo: 1 Banco de datos: MEDLINE Idioma: En Año: 2022 Tipo del documento: Article