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Nanoprojectile Secondary Ion Mass Spectrometry for Nanometrology of Nanoparticles and Their Interfaces.
Eller, Michael J; Sandoval, Jesse M; Verkhoturov, Stanislav V; Schweikert, Emile A.
  • Eller MJ; Department of Chemistry, Texas A&M University, College Station, Texas 77843, United States.
  • Sandoval JM; Department of Chemistry, Texas A&M University, College Station, Texas 77843, United States.
  • Verkhoturov SV; Department of Chemistry, Texas A&M University, College Station, Texas 77843, United States.
  • Schweikert EA; Department of Chemistry, Texas A&M University, College Station, Texas 77843, United States.
Anal Chem ; 94(22): 7868-7876, 2022 06 07.
Article en En | MEDLINE | ID: mdl-35594187

Texto completo: 1 Banco de datos: MEDLINE Asunto principal: Espectrometría de Masa de Ion Secundario / Nanopartículas Idioma: En Año: 2022 Tipo del documento: Article

Texto completo: 1 Banco de datos: MEDLINE Asunto principal: Espectrometría de Masa de Ion Secundario / Nanopartículas Idioma: En Año: 2022 Tipo del documento: Article