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Single-shot isotropic differential interference contrast microscopy.
Wang, Xinwei; Wang, Hao; Wang, Jinlu; Liu, Xingsi; Hao, Huijie; Tan, You Sin; Zhang, Yilei; Zhang, He; Ding, Xiangyan; Zhao, Weisong; Wang, Yuhang; Lu, Zhengang; Liu, Jian; Yang, Joel K W; Tan, Jiubin; Li, Haoyu; Qiu, Cheng-Wei; Hu, Guangwei; Ding, Xumin.
  • Wang X; Advanced Microscopy and Instrumentation Research Center, School of Instrumentation Science and Engineering, Harbin Institute of Technology, Harbin, 150080, China.
  • Wang H; School of Electrical and Electronic Engineering, 50 Nanyang Avenue, Nanyang Technological University, Singapore, 639798, Singapore.
  • Wang J; Engineering Product Development, Singapore University of Technology and Design, Singapore, 487372, Singapore.
  • Liu X; Department of Medical Oncology, Harbin Medical University Cancer Hospital, Harbin Medical University, Harbin, 150081, Heilongjiang, China.
  • Hao H; Department of Electrical and Computer Engineering, National University of Singapore, Singapore, 117583, Singapore.
  • Tan YS; Advanced Microscopy and Instrumentation Research Center, School of Instrumentation Science and Engineering, Harbin Institute of Technology, Harbin, 150080, China.
  • Zhang Y; Engineering Product Development, Singapore University of Technology and Design, Singapore, 487372, Singapore.
  • Zhang H; Center of Ultra-Precision Optoelectronic Instrument engineering, Harbin Institute of Technology, Harbin, 150080, China.
  • Ding X; Key Lab of Ultra-Precision Intelligent Instrumentation (Harbin Institute of Technology), Ministry of Industry and Information Technology, Harbin, 150080, China.
  • Zhao W; Advanced Microscopy and Instrumentation Research Center, School of Instrumentation Science and Engineering, Harbin Institute of Technology, Harbin, 150080, China.
  • Wang Y; Advanced Microscopy and Instrumentation Research Center, School of Instrumentation Science and Engineering, Harbin Institute of Technology, Harbin, 150080, China.
  • Lu Z; Advanced Microscopy and Instrumentation Research Center, School of Instrumentation Science and Engineering, Harbin Institute of Technology, Harbin, 150080, China.
  • Liu J; College of Mechanical and Electrical engineering, Northeast Forestry University, Harbin, 150040, Heilongjiang, China.
  • Yang JKW; Center of Ultra-Precision Optoelectronic Instrument engineering, Harbin Institute of Technology, Harbin, 150080, China.
  • Tan J; Key Lab of Ultra-Precision Intelligent Instrumentation (Harbin Institute of Technology), Ministry of Industry and Information Technology, Harbin, 150080, China.
  • Li H; Advanced Microscopy and Instrumentation Research Center, School of Instrumentation Science and Engineering, Harbin Institute of Technology, Harbin, 150080, China.
  • Qiu CW; Key Lab of Ultra-Precision Intelligent Instrumentation (Harbin Institute of Technology), Ministry of Industry and Information Technology, Harbin, 150080, China.
  • Hu G; Engineering Product Development, Singapore University of Technology and Design, Singapore, 487372, Singapore.
  • Ding X; Institute of Materials Research and Engineering (IMRE), A*STAR (Agency for Science, Technology and Research), 2 Fusionopolis Way, Singapore, 138634, Singapore.
Nat Commun ; 14(1): 2063, 2023 Apr 12.
Article en En | MEDLINE | ID: mdl-37045869