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Thermodynamically Driven Tilt Grain Boundaries of Monolayer Crystals Using Catalytic Liquid Alloys.
Choi, Min-Yeong; Choi, Chang-Won; Kim, Dong-Yeong; Jo, Moon-Ho; Kim, Yong-Sung; Choi, Si-Young; Kim, Cheol-Joo.
  • Choi MY; Center for Van der Waals Quantum Solids, Institute for Basic Science (IBS), Pohang 37673, Republic of Korea.
  • Choi CW; Department of Chemical Engineering, Pohang University of Science and Technology (POSTECH), Pohang 37673, Republic of Korea.
  • Kim DY; Center for Van der Waals Quantum Solids, Institute for Basic Science (IBS), Pohang 37673, Republic of Korea.
  • Jo MH; Department of Materials Science & Engineering, POSTECH, Pohang 37673, Republic of Korea.
  • Kim YS; Center for Van der Waals Quantum Solids, Institute for Basic Science (IBS), Pohang 37673, Republic of Korea.
  • Choi SY; Department of Chemical Engineering, Pohang University of Science and Technology (POSTECH), Pohang 37673, Republic of Korea.
  • Kim CJ; Center for Van der Waals Quantum Solids, Institute for Basic Science (IBS), Pohang 37673, Republic of Korea.
Nano Lett ; 23(10): 4516-4523, 2023 May 24.
Article en En | MEDLINE | ID: mdl-37184356
ABSTRACT
We report a method to precisely control the atomic defects at grain boundaries (GBs) of monolayer MoS2 by vapor-liquid-solid (VLS) growth using sodium molybdate liquid alloys, which serve as growth catalysts to guide the formations of the thermodynamically most stable GB structure. The Mo-rich chemical environment of the alloys results in Mo-polar 5|7 defects with a yield exceeding 95%. The photoluminescence (PL) intensity of VLS-grown polycrystalline MoS2 films markedly exceeds that of the films, exhibiting abundant S 5|7 defects, which are kinetically driven by vapor-solid-solid growths. Density functional theory calculations indicate that the enhanced PL intensity is due to the suppression of nonradiative recombination of charged excitons with donor-type defects of adsorbed Na elements on S 5|7 defects. Catalytic liquid alloys can aid in determining a type of atomic defect even in various polycrystalline 2D films, which accordingly provides a technical clue to engineer their properties.
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