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Influence of Bi doping on the electronic structure of (Ga,Mn)As epitaxial layers.
Yastrubchak, Oksana; Tataryn, Nataliia; Gluba, Lukasz; Mamykin, Sergii; Sadowski, Janusz; Andrearczyk, Tomasz; Domagala, Jaroslaw Z; Kondratenko, Olga; Romanyuk, Volodymyr; Fedchenko, Olena; Lytvynenko, Yaryna; Tkach, Olena; Vasilyev, Dmitry; Babenkov, Sergey; Medjanik, Katerina; Gas, Katarzyna; Sawicki, Maciej; Wosinski, Tadeusz; Schönhense, Gerd; Elmers, Hans-Joachim.
  • Yastrubchak O; V. E. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine, Kyiv, 03028, Ukraine. plazmonoki@gmail.com.
  • Tataryn N; V. E. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine, Kyiv, 03028, Ukraine.
  • Gluba L; Institute of Physics, Polish Academy of Sciences, Aleja Lotnikow 32/46, 02668, Warsaw, Poland.
  • Mamykin S; Institute of Physics, Maria Curie-Sklodowska University in Lublin, Pl. M. Curie-Sklodowskiej 1, 20031, Lublin, Poland.
  • Sadowski J; V. E. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine, Kyiv, 03028, Ukraine.
  • Andrearczyk T; Institute of Physics, Polish Academy of Sciences, Aleja Lotnikow 32/46, 02668, Warsaw, Poland.
  • Domagala JZ; Institute of Physics, Polish Academy of Sciences, Aleja Lotnikow 32/46, 02668, Warsaw, Poland.
  • Kondratenko O; Institute of Physics, Polish Academy of Sciences, Aleja Lotnikow 32/46, 02668, Warsaw, Poland.
  • Romanyuk V; V. E. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine, Kyiv, 03028, Ukraine.
  • Fedchenko O; V. E. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine, Kyiv, 03028, Ukraine.
  • Lytvynenko Y; Johannes Gutenberg-Universität, Institut für Physik, 55128, Mainz, Germany.
  • Tkach O; Johannes Gutenberg-Universität, Institut für Physik, 55128, Mainz, Germany.
  • Vasilyev D; Institute of Magnetism of the National Academy of Sciences of Ukraine and Ministry of Education and Science of Ukraine, Kyiv, 03142, Ukraine.
  • Babenkov S; Johannes Gutenberg-Universität, Institut für Physik, 55128, Mainz, Germany.
  • Medjanik K; Johannes Gutenberg-Universität, Institut für Physik, 55128, Mainz, Germany.
  • Gas K; Johannes Gutenberg-Universität, Institut für Physik, 55128, Mainz, Germany.
  • Sawicki M; Johannes Gutenberg-Universität, Institut für Physik, 55128, Mainz, Germany.
  • Wosinski T; Institute of Physics, Polish Academy of Sciences, Aleja Lotnikow 32/46, 02668, Warsaw, Poland.
  • Schönhense G; Institute of Physics, Polish Academy of Sciences, Aleja Lotnikow 32/46, 02668, Warsaw, Poland.
  • Elmers HJ; Institute of Physics, Polish Academy of Sciences, Aleja Lotnikow 32/46, 02668, Warsaw, Poland.
Sci Rep ; 13(1): 17278, 2023 Oct 12.
Article en En | MEDLINE | ID: mdl-37828106
ABSTRACT
The influence of the addition of Bi to the dilute ferromagnetic semiconductor (Ga,Mn)As on its electronic structure as well as on its magnetic and structural properties has been studied. Epitaxial (Ga,Mn)(Bi,As) layers of high structural perfection have been grown using low-temperature molecular-beam epitaxy. Post-growth annealing of the samples improves their structural and magnetic properties and increases the hole concentration in the layers. Hard X-ray angle-resolved photoemission spectroscopy reveals a strongly dispersing band in the Mn-doped layers, which crosses the Fermi energy and is caused by the high concentration of Mn-induced itinerant holes located in the valence band. An increased density of states near the Fermi level is attributed to additional localized Mn states. In addition to a decrease in the chemical potential with increasing Mn doping, we find significant changes in the valence band caused by the incorporation of a small atomic fraction of Bi atoms. The spin-orbit split-off band is shifted to higher binding energies, which is inconsistent with the impurity band model of the band structure in (Ga,Mn)As. Spectroscopic ellipsometry and modulation photoreflectance spectroscopy results confirm the valence band modifications in the investigated layers.