Enhanced Microstructural Uniformity in Sulfuric-Acid-Treated Poly(3,4-Ethylenedioxythiophene):Poly(Styrene Sulfonate) Films Using Raman Map Analysis.
Macromol Rapid Commun
; : e2400299, 2024 Jun 08.
Article
en En
| MEDLINE
| ID: mdl-38850109
ABSTRACT
Poly(3,4-ethylenedioxythiophene)poly(styrene sulfonate) (PEDOTPSS) films have emerged as potential alternatives to indium-tin oxide as transparent electrodes in optoelectronic devices because of their superior transparency, flexibility, and chemical doping stability. However, pristine PEDOTPSS films show low conductivities because the insulating PSS-rich domains isolate the conductive PEDOT-rich domains. In this study, the conductivities and corresponding spatially resolved Raman properties of PEDOTPSS thin films treated with various concentrations of H2SO4 are presented. After the PEDOTPSS films are treated with the H2SO4 solutions, their electrical conductivities are significantly improved from 0.5 (nontreated) to 4358 S cm-1 (100% v/v). Raman heat maps of the peak shifts and widths of the CαâCß stretching mode are constructed. A blueshift and width decrease of the CαâCß Raman mode in PEDOT are uniformly observed in the entire measurement area (20 × 20 µm2), indicating that microstructural transitions are successfully accomplished across the area from the coiled to linear conformation and high crystallinity upon H2SO4 treatment. Thus, it is proved that comprehensive Raman map analysis can be easily utilized to clarify microstructural properties distributed in large areas induced by various dopants. These results also offer valuable insights for evaluating and optimizing the performance of other conductive thin films.
Texto completo:
1
Banco de datos:
MEDLINE
Idioma:
En
Año:
2024
Tipo del documento:
Article