Development of scanning X-ray microscopes for materials science spectromicroscopy at the Advanced Light Source.

Warwick, T; Ade, H; Cerasari, S; Denlinger, J; Franck, K; Garcia, A; Hayakawa, S; Hitchcock, A; Kikuma, J; Klingler, S; Kortright, J; Morisson, G; Moronne, M; Rightor, E; Rotenberg, E; Seal, S; Shin, H J; Steele, W F; Tonner, B P

Warwick, T; Ade, H; Cerasari, S; Denlinger, J; Franck, K; Garcia, A; Hayakawa, S; Hitchcock, A; Kikuma, J; Klingler, S; Kortright, J; Morisson, G; Moronne, M; Rightor, E; Rotenberg, E; Seal, S; Shin, H J; Steele, W F; Tonner, B P.

Afiliação

Warwick T; Lawrence Berkeley National Laboratory, University of California, Berkeley, California, USA.

J Synchrotron Radiat ; 5(Pt 3): 1090-2, 1998 May 01.

Article em En | MEDLINE | ID: mdl-15263755

RESUMO

The development of two zone-plate microscopes for X-ray spectroscopic analysis of materials is described. This pair of instruments will provide imaging NEXAFS analysis of samples in transmission at atmospheric pressure and imaging XPS and NEXAFS analysis of sample surfaces in a UHV environment.

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Base de dados: MEDLINE Idioma: En Ano de publicação: 1998 Tipo de documento: Article

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Base de dados: MEDLINE Idioma: En Ano de publicação: 1998 Tipo de documento: Article