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Towards a nanoscale view of fungal surfaces.
Dague, Etienne; Gilbert, Yann; Verbelen, Claire; Andre, Guillaume; Alsteens, David; Dufrêne, Yves F.
Afiliação
  • Dague E; Unité de Chimie des Interfaces, Université Catholique de Louvain, Croix du Sud 2/18, B-1348 Louvain-la-Neuve, Belgium.
Yeast ; 24(4): 229-37, 2007 Apr.
Article em En | MEDLINE | ID: mdl-17230582
In the past years, atomic force microscopy (AFM) has offered novel possibilities for exploring the nanoscale surface properties of fungal cells. For the first time, AFM imaging enables investigators to visualize fine surface structures, such as rodlets, directly on native hydrated cells. Moreover, real-time imaging can be used to follow cell surface dynamics during cell growth and to monitor the effect of molecules such as enzymes and drugs. In fact, AFM is much more than a microscope in that when used in the force spectroscopy mode, it allows measurement of physicochemical properties such as surface energy and surface charge, to probe the elasticity of cell wall components and macromolecules, and to analyse the force and localization of molecular recognition events.
Assuntos
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Base de dados: MEDLINE Assunto principal: Parede Celular / Microscopia de Força Atômica / Nanotecnologia / Fungos Idioma: En Ano de publicação: 2007 Tipo de documento: Article
Buscar no Google
Base de dados: MEDLINE Assunto principal: Parede Celular / Microscopia de Força Atômica / Nanotecnologia / Fungos Idioma: En Ano de publicação: 2007 Tipo de documento: Article