Calibrating a tuning fork for use as a scanning probe microscope force sensor.
Rev Sci Instrum
; 78(6): 063704, 2007 Jun.
Article
em En
| MEDLINE
| ID: mdl-17614613
ABSTRACT
Quartz tuning forks mounted with sharp tips provide an alternate method to silicon microcantilevers for probing the tip-substrate interaction in scanning probe microscopy. The high quality factor and stable resonant frequency of the tuning fork allow accurate measurements of small shifts in the resonant frequency as the tip approaches the substrate. To permit an accurate measure of surface interaction forces, the electrical and piezoelectromechanical properties of a tuning fork have been characterized using a fiber optical interferometer.
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Base de dados:
MEDLINE
Assunto principal:
Transdutores
/
Algoritmos
/
Análise de Falha de Equipamento
/
Microscopia de Varredura por Sonda
/
Manometria
Tipo de estudo:
Diagnostic_studies
País como assunto:
America do norte
Idioma:
En
Ano de publicação:
2007
Tipo de documento:
Article