Three-dimensional electron density mapping of shape-controlled nanoparticle by focused hard X-ray diffraction microscopy.
Nano Lett
; 10(5): 1922-6, 2010 May 12.
Article
em En
| MEDLINE
| ID: mdl-20402526
ABSTRACT
Coherent diffraction microscopy using highly focused hard X-ray beams allows us to three-dimensionally observe thick objects with a high spatial resolution, also providing us with unique structural information, i.e., electron density distribution, not obtained by X-ray tomography with lenses, atom probe microscopy, or electron tomography. We measured high-contrast coherent X-ray diffraction patterns of a shape-controlled Au/Ag nanoparticle and successfully reconstructed a projection and a three-dimensional image of the nanoparticle with a single pixel (or a voxel) size of 4.2 nm in each dimension. The small pits on the surface and a hollow interior were clearly visible. The Au-rich regions were identified based on the electron density distribution, which provided insight into the formation of Au/Ag nanoboxes.
Texto completo:
1
Base de dados:
MEDLINE
Assunto principal:
Difração de Raios X
/
Microscopia Eletrônica
/
Imageamento Tridimensional
/
Nanoestruturas
Idioma:
En
Ano de publicação:
2010
Tipo de documento:
Article