Calibrated NEXAFS spectra of common conjugated polymers.
J Chem Phys
; 134(2): 024702, 2011 Jan 14.
Article
em En
| MEDLINE
| ID: mdl-21241141
ABSTRACT
Near edge x-ray absorption fine structure (NEXAFS) spectroscopy has evolved into a powerful characterization tool for polymeric materials and is increasingly being used to elucidate composition and orientation in thin films of relevance to organic electronic devices. For accurate quantitative compositional analysis, insight into the electronic structure and the ability to assess molecular orientation, reliable reference spectra with known energy resolution and calibrated energy scale are required. We report a set of such NEXAFS spectra from 23 semiconducting polymers and some related materials that are frequently used in organic device research.
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Base de dados:
MEDLINE
Assunto principal:
Polímeros
Idioma:
En
Ano de publicação:
2011
Tipo de documento:
Article