Your browser doesn't support javascript.
loading
Ultrahigh infrared normal spectral emissivity of microstructured silicon coating Au film.
Feng, Guojin; Li, Yuan; Wang, Yu; Li, Ping; Zhu, Jingtao; Zhao, Li.
Afiliação
  • Feng G; Department of Physics and Surface Physics National Key Laboratory, Fudan University, Shanghai, China.
Opt Lett ; 37(3): 299-301, 2012 Feb 01.
Article em En | MEDLINE | ID: mdl-22297332
ABSTRACT
We studied infrared normal spectral emissivity on quasi-periodic microstructured silicon, which was prepared by femtosecond laser irradiation in SF6 ambient gas, coated with 100 nm thick Au thin film. The observed emissivity is higher than any reported previously for a flat material with a thickness of less than 0.5 mm, at a temperature range of 200 °C to 400 °C. The emissivity over the measured wavelength region increases with temperature and the spike height. These results show the potential to be used as a flat blackbody source or for applications in infrared thermal sensor, detector, and stealth military technology.

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2012 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2012 Tipo de documento: Article