Direct correlation between electric and structural properties during solidification of poly(3-hexylthiophene) drop-cast films.
Macromol Rapid Commun
; 33(20): 1765-9, 2012 Oct 26.
Article
em En
| MEDLINE
| ID: mdl-22778000
ABSTRACT
Structural and electrical properties of semicrystalline P3HT cast films onto Si/SiO(2) surface are studied during the solidification under applied electric field in lateral OFET geometry. During evaporation of the solvent, the formation of P3HT crystallites is monitored simultaneously by time-resolved X-ray diffraction and by source-drain current measurements. The electrical current is reaching its maximum in two pronounced regimes already before complete solidification of the polymer as detected by X-ray diffraction intensities. The monitored complex time dependence of current and X-ray intensities reveals a highest conducting level for the gel-like state.
Texto completo:
1
Base de dados:
MEDLINE
Assunto principal:
Tiofenos
/
Condutividade Elétrica
Idioma:
En
Ano de publicação:
2012
Tipo de documento:
Article