Practical Issues for Atom Probe Tomography Analysis of III-Nitride Semiconductor Materials.

Tang, Fengzai; Moody, Michael P; Martin, Tomas L; Bagot, Paul A J; Kappers, Menno J; Oliver, Rachel A.

Afiliação

Tang F; 1Department of Materials Science and Metallurgy,University of Cambridge,27 Charles Babbage Road,Cambridge CB3 0FS,UK.
Moody MP; 2Departments of Materials,University of Oxford,Parks Road,Oxford OX1 3PH,UK.
Martin TL; 2Departments of Materials,University of Oxford,Parks Road,Oxford OX1 3PH,UK.
Bagot PA; 2Departments of Materials,University of Oxford,Parks Road,Oxford OX1 3PH,UK.
Kappers MJ; 1Department of Materials Science and Metallurgy,University of Cambridge,27 Charles Babbage Road,Cambridge CB3 0FS,UK.
Oliver RA; 1Department of Materials Science and Metallurgy,University of Cambridge,27 Charles Babbage Road,Cambridge CB3 0FS,UK.

Microsc Microanal ; 21(3): 544-56, 2015 Jun.

Article em En | MEDLINE | ID: mdl-25926083