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Nanoscale Probing of Local Electrical Characteristics on MBE-Grown Bi2Te3 Surfaces under Ambient Conditions.
Macedo, Rita J; Harrison, Sara E; Dorofeeva, Tatiana S; Harris, James S; Kiehl, Richard A.
Afiliação
  • Macedo RJ; †Department of Electrical and Computer Engineering, University of California Davis, Davis, California 95616, United States.
  • Harrison SE; ‡Department of Electrical Engineering, Stanford University, Stanford, California 94305, United States.
  • Dorofeeva TS; †Department of Electrical and Computer Engineering, University of California Davis, Davis, California 95616, United States.
  • Harris JS; ‡Department of Electrical Engineering, Stanford University, Stanford, California 94305, United States.
  • Kiehl RA; †Department of Electrical and Computer Engineering, University of California Davis, Davis, California 95616, United States.
Nano Lett ; 15(7): 4241-7, 2015 Jul 08.
Article em En | MEDLINE | ID: mdl-26030139
The local electrical characteristics on the surface of MBE-grown Bi2Te3 are probed under ambient conditions by conductive atomic force microscopy. Nanoscale mapping reveals a 10-100× enhancement in current at step-edges compared to that on terraces. Analysis of the local current-voltage characteristics indicates that the transport mechanism is similar for step-edges and terraces. Comparison of the results with those for control samples shows that the current enhancement is not a measurement artifact but instead is due to local differences in electronic properties. The likelihood of various possible mechanisms is discussed. The absence of enhancement at the step-edges for graphite terraces is consistent with the intriguing possibility that spin-orbit coupling and topological effects play a significant role in the step-edge current enhancement in Bi2Te3.
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Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2015 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2015 Tipo de documento: Article