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Effects of detector dead-time on quantitative analyses involving boron and multi-hit detection events in atom probe tomography.
Meisenkothen, Frederick; Steel, Eric B; Prosa, Ty J; Henry, Karen T; Prakash Kolli, R.
Afiliação
  • Meisenkothen F; Materials Measurement Science Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA. Electronic address: frederick.meisenkothen@nist.gov.
  • Steel EB; Materials Measurement Science Division, National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.
  • Prosa TJ; CAMECA Instruments, Inc., 5500 Nobel Drive, Madison, WI 53711, USA.
  • Henry KT; Intel Corporation, Hillsboro, OR, 97124, USA.
  • Prakash Kolli R; Department of Materials Science and Engineering, 2144 Chemical and Nuclear Engineering, Building #090, University of Maryland, College Park, MD 20742, USA.
Ultramicroscopy ; 159 Pt 1: 101-11, 2015 Dec.
Article em En | MEDLINE | ID: mdl-26342554
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Texto completo: 1 Base de dados: MEDLINE Tipo de estudo: Diagnostic_studies Idioma: En Ano de publicação: 2015 Tipo de documento: Article
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Base de dados: MEDLINE Tipo de estudo: Diagnostic_studies Idioma: En Ano de publicação: 2015 Tipo de documento: Article