Significant enhancement of negative secondary ion yields by cluster ion bombardment combined with cesium flooding.

Philipp, Patrick; Angerer, Tina B; Sämfors, Sanna; Blenkinsopp, Paul; Fletcher, John S; Wirtz, Tom.

Afiliação

Philipp P; Advanced Instrumentation for Ion Nano-Analytics (AINA), MRT Department, Luxembourg Institute of Science and Technology (LIST) , L-4422 Belvaux, Luxembourg.
Angerer TB; Department of Chemistry and Molecular Biology, University of Gothenburg , SE-412 96, Gothenburg, Sweden.
Sämfors S; Department of Chemistry and Chemical Engineering, Chalmers University of Technology , SE-412 90 Gothenburg, Sweden.
Blenkinsopp P; Ionoptika Ltd. , Chandlers Ford, Southampton, U.K.
Fletcher JS; Department of Chemistry and Molecular Biology, University of Gothenburg , SE-412 96, Gothenburg, Sweden.
Wirtz T; Department of Chemistry and Chemical Engineering, Chalmers University of Technology , SE-412 90 Gothenburg, Sweden.

Anal Chem ; 87(19): 10025-32, 2015 Oct 06.

Article em En | MEDLINE | ID: mdl-26378890

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2015 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2015 Tipo de documento: Article