Epitaxial integration of a nanoscale BiFeO3 phase boundary with silicon.
Nanoscale
; 8(3): 1322-6, 2016 Jan 21.
Article
em En
| MEDLINE
| ID: mdl-26689266
ABSTRACT
The successful integration of the strain-driven nanoscale phase boundary of BiFeO3 onto a silicon substrate is demonstrated with extraordinary ferroelectricity and ferromagnetism. The detailed strain history is delineated through a reciprocal space mapping technique. We have found that a distorted monoclinic phase forms prior to a tetragonal-like phase, a phenomenon which may correlates with the thermal strain induced during the growth process.
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MEDLINE
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En
Ano de publicação:
2016
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Article