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Vertical 2D/3D Semiconductor Heterostructures Based on Epitaxial Molybdenum Disulfide and Gallium Nitride.
Ruzmetov, Dmitry; Zhang, Kehao; Stan, Gheorghe; Kalanyan, Berc; Bhimanapati, Ganesh R; Eichfeld, Sarah M; Burke, Robert A; Shah, Pankaj B; O'Regan, Terrance P; Crowne, Frank J; Birdwell, A Glen; Robinson, Joshua A; Davydov, Albert V; Ivanov, Tony G.
Afiliação
  • Ruzmetov D; Sensors and Electron Devices Directorate, U.S. Army Research Laboratory , Adelphi, Maryland 20783, United States.
  • Zhang K; Material Measurement Laboratory, National Institute of Standards and Technology , Gaithersburg, Maryland 20899, United States.
  • Stan G; Department of Materials Science and Engineering & Center for Two-Dimensional and Layered Materials, The Pennsylvania State University , University Park, Pennsylvania 16802, United States.
  • Kalanyan B; Material Measurement Laboratory, National Institute of Standards and Technology , Gaithersburg, Maryland 20899, United States.
  • Bhimanapati GR; Material Measurement Laboratory, National Institute of Standards and Technology , Gaithersburg, Maryland 20899, United States.
  • Eichfeld SM; Department of Materials Science and Engineering & Center for Two-Dimensional and Layered Materials, The Pennsylvania State University , University Park, Pennsylvania 16802, United States.
  • Burke RA; Department of Materials Science and Engineering & Center for Two-Dimensional and Layered Materials, The Pennsylvania State University , University Park, Pennsylvania 16802, United States.
  • Shah PB; Sensors and Electron Devices Directorate, U.S. Army Research Laboratory , Adelphi, Maryland 20783, United States.
  • O'Regan TP; Sensors and Electron Devices Directorate, U.S. Army Research Laboratory , Adelphi, Maryland 20783, United States.
  • Crowne FJ; Sensors and Electron Devices Directorate, U.S. Army Research Laboratory , Adelphi, Maryland 20783, United States.
  • Birdwell AG; Sensors and Electron Devices Directorate, U.S. Army Research Laboratory , Adelphi, Maryland 20783, United States.
  • Robinson JA; Sensors and Electron Devices Directorate, U.S. Army Research Laboratory , Adelphi, Maryland 20783, United States.
  • Davydov AV; Department of Materials Science and Engineering & Center for Two-Dimensional and Layered Materials, The Pennsylvania State University , University Park, Pennsylvania 16802, United States.
  • Ivanov TG; Material Measurement Laboratory, National Institute of Standards and Technology , Gaithersburg, Maryland 20899, United States.
ACS Nano ; 10(3): 3580-8, 2016 Mar 22.
Article em En | MEDLINE | ID: mdl-26866442
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Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2016 Tipo de documento: Article
Texto completo
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XML
PubMed Links
Buscar no Google

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2016 Tipo de documento: Article