Contactless electrical conductivity measurement of metallic submicron-grain material: Application to the study of aluminum with severe plastic deformation.

Mito, M; Matsui, H; Yoshida, T; Anami, T; Tsuruta, K; Deguchi, H; Iwamoto, T; Terada, D; Miyajima, Y; Tsuji, N

Mito, M; Matsui, H; Yoshida, T; Anami, T; Tsuruta, K; Deguchi, H; Iwamoto, T; Terada, D; Miyajima, Y; Tsuji, N.

Afiliação

Mito M; Graduate School of Engineering, Kyushu Institute of Technology, Kitakyushu 804-8550, Japan.
Matsui H; Graduate School of Engineering, Kyushu Institute of Technology, Kitakyushu 804-8550, Japan.
Yoshida T; Graduate School of Engineering, Kyushu Institute of Technology, Kitakyushu 804-8550, Japan.
Anami T; Graduate School of Engineering, Kyushu Institute of Technology, Kitakyushu 804-8550, Japan.
Tsuruta K; Graduate School of Engineering, Kyushu Institute of Technology, Kitakyushu 804-8550, Japan.
Deguchi H; Graduate School of Engineering, Kyushu Institute of Technology, Kitakyushu 804-8550, Japan.
Iwamoto T; Institute for Materials Chemistry and Engineering, Kyushu University, Fukuoka 819-0395, Japan.
Terada D; Faculty of Engineering, Chiba Institute of Technology, Narashino 275-0016, Japan.
Miyajima Y; School of Materials and Chemical Technology, Tokyo Institute of Technology, Yokohama 226-8502, Japan.
Tsuji N; Graduate School of Engineering, Kyoto University, Kyoto 606-8501, Japan.

Rev Sci Instrum ; 87(5): 053905, 2016 05.

Article em En | MEDLINE | ID: mdl-27250440

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Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2016 Tipo de documento: Article

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Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2016 Tipo de documento: Article