Nanoscale Three-Dimensional Microstructural Characterization of an Sn-Rich Solder Alloy Using High-Resolution Transmission X-Ray Microscopy (TXM).

Kaira, Chandrashekara S; Mayer, Carl R; De Andrade, V; De Carlo, Francesco; Chawla, Nikhilesh.

Afiliação

Kaira CS; 1Materials Science and Engineering,Arizona State University,Tempe,AZ 85287-6106,USA.
Mayer CR; 1Materials Science and Engineering,Arizona State University,Tempe,AZ 85287-6106,USA.
De Andrade V; 2Advanced Photon Source,Argonne National Laboratory,Building 401,9700 S. Cass Avenue,Argonne,IL 60439,USA.
De Carlo F; 2Advanced Photon Source,Argonne National Laboratory,Building 401,9700 S. Cass Avenue,Argonne,IL 60439,USA.
Chawla N; 1Materials Science and Engineering,Arizona State University,Tempe,AZ 85287-6106,USA.

Microsc Microanal ; 22(4): 808-13, 2016 08.

Article em En | MEDLINE | ID: mdl-27426439