A comparative study on defect estimation using XPS and Raman spectroscopy in few layer nanographitic structures.

Ganesan, K; Ghosh, Subrata; Gopala Krishna, Nanda; Ilango, S; Kamruddin, M; Tyagi, A K.

Afiliação

Ganesan K; Materials Science Group, Indira Gandhi Centre for Atomic Research, Kalpakkam - 603102, India. kganesan@igcar.gov.in.
Ghosh S; Materials Science Group, Indira Gandhi Centre for Atomic Research, Kalpakkam - 603102, India. kganesan@igcar.gov.in and Homi Bhabha National Institute, Anushaktinagar, Mumbai - 400 094, India.
Gopala Krishna N; Corrosion Science and Technology Group, Indira Gandhi Centre for Atomic Research, Kalpakkam - 603102, India.
Ilango S; Materials Science Group, Indira Gandhi Centre for Atomic Research, Kalpakkam - 603102, India. kganesan@igcar.gov.in.
Kamruddin M; Materials Science Group, Indira Gandhi Centre for Atomic Research, Kalpakkam - 603102, India. kganesan@igcar.gov.in and Homi Bhabha National Institute, Anushaktinagar, Mumbai - 400 094, India.
Tyagi AK; Materials Science Group, Indira Gandhi Centre for Atomic Research, Kalpakkam - 603102, India. kganesan@igcar.gov.in and Homi Bhabha National Institute, Anushaktinagar, Mumbai - 400 094, India.

Phys Chem Chem Phys ; 18(32): 22160-7, 2016 Aug 10.

Article em En | MEDLINE | ID: mdl-27445041

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2016 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2016 Tipo de documento: Article