Your browser doesn't support javascript.
loading
Using NIST Crystal Data Within Siemens Software for Four-Circle and SMART CCD Diffractometers.
Byram, Susan K; Campana, Charles F; Fait, James; Sparks, Robert A.
Afiliação
  • Byram SK; Analytical Instrumentation Group, Siemens Energy and Automation, 6300 Enterprise Lane, Madison, WI 53719-1173.
  • Campana CF; Analytical Instrumentation Group, Siemens Energy and Automation, 6300 Enterprise Lane, Madison, WI 53719-1173.
  • Fait J; Analytical Instrumentation Group, Siemens Energy and Automation, 6300 Enterprise Lane, Madison, WI 53719-1173.
  • Sparks RA; Analytical Instrumentation Group, Siemens Energy and Automation, 6300 Enterprise Lane, Madison, WI 53719-1173.
J Res Natl Inst Stand Technol ; 101(3): 295-300, 1996.
Article em En | MEDLINE | ID: mdl-27805166
ABSTRACT
NIST Crystal Data developed at The National Institute for Standards and Technology has been incorporated with Siemens single crystal software for data collection on four-circle and two-dimensional CCD diffractometers. Why this database is useful in the process of single crystal structure determination, and how the database is searched, are described. Ideas for future access to this and other databases are presented.
Palavras-chave

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 1996 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 1996 Tipo de documento: Article