Your browser doesn't support javascript.
loading
High-precision measurement of magnetic penetration depth in superconducting films.
He, X; Gozar, A; Sundling, R; Bozovic, I.
Afiliação
  • He X; Department of Applied Physics, Yale University, New Haven, Connecticut 06511, USA.
  • Gozar A; Department of Applied Physics, Yale University, New Haven, Connecticut 06511, USA.
  • Sundling R; Zensoft, Inc., Madison, Wisconsin 53705, USA.
  • Bozovic I; Department of Applied Physics, Yale University, New Haven, Connecticut 06511, USA.
Rev Sci Instrum ; 87(11): 113903, 2016 Nov.
Article em En | MEDLINE | ID: mdl-27910375
Buscar no Google
Imprimir
XML
PubMed Links

Base de dados: MEDLINE Idioma: En Ano de publicação: 2016 Tipo de documento: Article
Buscar no Google
Imprimir
XML
PubMed Links

Base de dados: MEDLINE Idioma: En Ano de publicação: 2016 Tipo de documento: Article