Report on the CCT Supplementary Comparison S1 of Infrared Spectral Normal Emittance/Emissivity.

Hanssen, Leonard; Wilthan, B; Monte, Christian; Hollandt, Jörg; Hameury, Jacques; Filtz, Jean-Remy; Girard, Ferruccio; Battuello, Mauro; Ishii, Juntaro

Hanssen, Leonard; Wilthan, B; Monte, Christian; Hollandt, Jörg; Hameury, Jacques; Filtz, Jean-Remy; Girard, Ferruccio; Battuello, Mauro; Ishii, Juntaro.

Afiliação

Hanssen L; National Institute of Standards and Technology (NIST), Sensor Science Division, Gaithersburg, MD, USA.
Wilthan B; National Institute of Standards and Technology (NIST), Sensor Science Division, Gaithersburg, MD, USA; currently with NIST, Applied Chemical and Materials Division, Boulder, CO, USA.
Monte C; Physikalisch-Technische Bundesanstalt (PTB), Temperature and Synchrotron Divison, Berlin, Germany.
Hollandt J; Physikalisch-Technische Bundesanstalt (PTB), Temperature and Synchrotron Divison, Berlin, Germany.
Hameury J; Laboratoire National de Métrologie et d'Essais (LNE), Photonics and Energy Division, Trappes, France.
Filtz JR; Laboratoire National de Métrologie et d'Essais (LNE), Photonics and Energy Division, Trappes, France.
Girard F; Instituto Nazionale di Ricerca Metrologica (INRIM), Division of Metrology for Quality of Life, Torino, Italy.
Battuello M; Instituto Nazionale di Ricerca Metrologica (INRIM), Division of Metrology for Quality of Life, Torino, Italy.
Ishii J; National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Japan.