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Correspondence: Phantom phonon localization in relaxors.
Gehring, Peter M; Parshall, Dan; Harriger, Leland; Stock, Chris; Xu, Guangyong; Li, Xiaobing; Luo, Haosu.
Afiliação
  • Gehring PM; NIST Center for Neutron Research, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD, 20899-600, USA. peter.gehring@nist.gov.
  • Parshall D; NIST Center for Neutron Research, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD, 20899-600, USA.
  • Harriger L; NIST Center for Neutron Research, National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD, 20899-600, USA.
  • Stock C; School of Astronomy and Physics, University of Edinburgh, Edinburgh, EH9 3JZ, UK.
  • Xu G; Condensed Matter Physics and Materials Science Department, Brookhaven National Laboratory, Upton, New York, NY, 11973, USA.
  • Li X; Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai, 201800, China.
  • Luo H; Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai, 201800, China.
Nat Commun ; 8(1): 1935, 2017 12 05.
Article em En | MEDLINE | ID: mdl-29208944

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2017 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2017 Tipo de documento: Article