Remarkably High Hole Mobility Metal-Oxide Thin-Film Transistors.

Shih, Cheng Wei; Chin, Albert; Lu, Chun Fu; Su, Wei Fang.

Afiliação

Shih CW; Department of Electronics Engineering, National Chiao Tung University, Hsinchu, 300, Taiwan.
Chin A; Department of Electronics Engineering, National Chiao Tung University, Hsinchu, 300, Taiwan. achin@faculty.nctu.edu.tw.
Lu CF; Depatment of Materials Science & Engineering, National Taiwan University, Taipei, 10617, Taiwan.
Su WF; Depatment of Materials Science & Engineering, National Taiwan University, Taipei, 10617, Taiwan.

Sci Rep ; 8(1): 889, 2018 01 17.

Article em En | MEDLINE | ID: mdl-29343726

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2018 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2018 Tipo de documento: Article