High Reliability of Ag Reflectors with AgCu Alloy for High Efficiency GaN-Based Light Emitting Diodes.

Kwon, Joon-Sung; Beak, Ji-Young; Kang, Nam-Woo; Hong, Minki; Lim, Changjin; Im, JaeHyuk; Oh, Semi; Jeong, Bong-Yong; Cho, Soohaeng; Kim, Kyoung-Kook.

Afiliação

Kwon JS; Department of Advanced Convergence Technology and Research Institute for Advanced Convergence Technology, Korea Polytechnic University, Siheung-Si 15073, Republic of Korea.
Beak JY; Department of Advanced Convergence Technology and Research Institute for Advanced Convergence Technology, Korea Polytechnic University, Siheung-Si 15073, Republic of Korea.
Kang NW; Department of Advanced Convergence Technology and Research Institute for Advanced Convergence Technology, Korea Polytechnic University, Siheung-Si 15073, Republic of Korea.
Hong M; Department of Physics, Yonsei University, Wonju-Si 26493, Republic of Korea.
Lim C; Department of Physics, Yonsei University, Wonju-Si 26493, Republic of Korea.
Im J; Department of Physics, Yonsei University, Wonju-Si 26493, Republic of Korea.
Oh S; School of Materials Science and Engineering, Gwangju Institute of Science and Technology, Gwangju 61005, Republic of Korea.
Jeong BY; Korea Evaluation Institute of Industrial Technology, Daegu 41069, Republic of Korea.
Cho S; Department of Physics, Yonsei University, Wonju-Si 26493, Republic of Korea.
Kim KK; Department of Advanced Convergence Technology and Research Institute for Advanced Convergence Technology, Korea Polytechnic University, Siheung-Si 15073, Republic of Korea.

J Nanosci Nanotechnol ; 18(9): 5893-5898, 2018 09 01.

Article em En | MEDLINE | ID: mdl-29677712

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2018 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2018 Tipo de documento: Article