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High-Contrast SEM Imaging of Supported Few-Layer Graphene for Differentiating Distinct Layers and Resolving Fine Features: There is Plenty of Room at the Bottom.
Huang, Li; Zhang, Dan; Zhang, Fei-Hu; Feng, Zhi-Hong; Huang, Yu-Dong; Gan, Yang.
Afiliação
  • Huang L; School of Chemistry and Chemical Engineering, Harbin Institute of Technology, Harbin, 150001, China.
  • Zhang D; MIIT Key Laboratory of Critical Materials Technology for New Energy Conversion and Storage, School of Chemistry and Chemical Engineering, Harbin Institute of Technology, Harbin, 150001, China.
  • Zhang FH; School of Chemistry and Chemical Engineering, Harbin Institute of Technology, Harbin, 150001, China.
  • Feng ZH; MIIT Key Laboratory of Critical Materials Technology for New Energy Conversion and Storage, School of Chemistry and Chemical Engineering, Harbin Institute of Technology, Harbin, 150001, China.
  • Huang YD; Manufacturing Engineering for Aviation and Aerospace, School of Mechatronics Engineering, Harbin Institute of Technology, Harbin, 150001, China.
  • Gan Y; ASCI Laboratory, Hebei Semiconductor Research Institute, Shijiazhuang, 050051, China.
Small ; 14(22): e1704190, 2018 May.
Article em En | MEDLINE | ID: mdl-29717816
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Texto completo: 1 Base de dados: MEDLINE Tipo de estudo: Prognostic_studies Idioma: En Ano de publicação: 2018 Tipo de documento: Article
Texto completo
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XML
PubMed Links
Buscar no Google

Texto completo: 1 Base de dados: MEDLINE Tipo de estudo: Prognostic_studies Idioma: En Ano de publicação: 2018 Tipo de documento: Article