Accurate Measurements of Wall Shear Stress on a Plate with Elliptic Leading Edge.

Ding, Guang-Hui; Ma, Bing-He; Deng, Jin-Jun; Yuan, Wei-Zheng; Liu, Kang.

Afiliação

Ding GH; Key Laboratory of Micro/Nano Systems for Aerospace, Ministry of Education, Northwestern Polytechnical University, Xi'an 710072, China. 2015100434@mail.nwpu.edu.cn.
Ma BH; Key Laboratory of Micro/Nano Systems for Aerospace, Ministry of Education, Northwestern Polytechnical University, Xi'an 710072, China. mabh@nwpu.edu.cn.
Deng JJ; Key Laboratory of Micro/Nano Systems for Aerospace, Ministry of Education, Northwestern Polytechnical University, Xi'an 710072, China. dengjj@nwpu.edu.cn.
Yuan WZ; Key Laboratory of Micro/Nano Systems for Aerospace, Ministry of Education, Northwestern Polytechnical University, Xi'an 710072, China. yuanwz@nwpu.edu.cn.
Liu K; Key Laboratory of Micro/Nano Systems for Aerospace, Ministry of Education, Northwestern Polytechnical University, Xi'an 710072, China. liukang2016@mail.nwpu.edu.cn.

Sensors (Basel) ; 18(8)2018 Aug 15.

Article em En | MEDLINE | ID: mdl-30111724