Investigation of Multi-Plane Scheme for Compensation of Fringe Effect of Electrical Resistance Tomography Sensor.

Tian, Wenbin; Liang, Xiaofeng; Qu, Xiaolei; Sun, Jiangtao; Gao, Shuo; Xu, Lijun; Yang, Wuqiang.

Afiliação

Tian W; School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing 100191, China.
Liang X; Beijing Advanced Innovation Center for Big Data-Based Precision Medicine, Beihang University, Beijing 100191, China.
Qu X; School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing 100191, China.
Sun J; School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing 100191, China.
Gao S; Beijing Advanced Innovation Center for Big Data-Based Precision Medicine, Beihang University, Beijing 100191, China.
Xu L; School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing 100191, China. jiangtao_sun@buaa.edu.cn.
Yang W; Beijing Advanced Innovation Center for Big Data-Based Precision Medicine, Beihang University, Beijing 100191, China. jiangtao_sun@buaa.edu.cn.

Sensors (Basel) ; 19(14)2019 Jul 16.

Article em En | MEDLINE | ID: mdl-31315246