Absolute Depth Measurement Using Multiphase Normalized Cross-Correlation for Precise Optical Profilometry.

Duong, Duc-Hieu; Chen, Chin-Sheng; Chen, Liang-Chia.

Afiliação

Duong DH; Graduate Institute of Automation Technology, College of Mechanical & Electrical Engineering, No. 1, Section 3, National Taipei University of Technology, Zhong-Xiao E. Rd, Da'an District, Taipei City 10608, Taiwan. duongduchieu85@gmail.com.
Chen CS; Graduate Institute of Automation Technology, College of Mechanical & Electrical Engineering, No. 1, Section 3, National Taipei University of Technology, Zhong-Xiao E. Rd, Da'an District, Taipei City 10608, Taiwan. saint@mail.ntut.edu.tw.
Chen LC; Graduate Institute of Automation Technology, College of Mechanical & Electrical Engineering, No. 1, Section 3, National Taipei University of Technology, Zhong-Xiao E. Rd, Da'an District, Taipei City 10608, Taiwan. lchen@ntu.edu.tw.

Sensors (Basel) ; 19(21)2019 Oct 28.

Article em En | MEDLINE | ID: mdl-31661897