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A Chemically Orthogonal Hole Transport Layer for Efficient Colloidal Quantum Dot Solar Cells.
Biondi, Margherita; Choi, Min-Jae; Ouellette, Olivier; Baek, Se-Woong; Todorovic, Petar; Sun, Bin; Lee, Seungjin; Wei, Mingyang; Li, Peicheng; Kirmani, Ahmad R; Sagar, Laxmi K; Richter, Lee J; Hoogland, Sjoerd; Lu, Zheng-Hong; García de Arquer, F Pelayo; Sargent, Edward H.
Afiliação
  • Biondi M; Department of Electrical and Computer Engineering, University of Toronto, 10 King's College Road, Toronto, Ontario, M5S 3G4, Canada.
  • Choi MJ; Department of Electrical and Computer Engineering, University of Toronto, 10 King's College Road, Toronto, Ontario, M5S 3G4, Canada.
  • Ouellette O; Department of Electrical and Computer Engineering, University of Toronto, 10 King's College Road, Toronto, Ontario, M5S 3G4, Canada.
  • Baek SW; Department of Electrical and Computer Engineering, University of Toronto, 10 King's College Road, Toronto, Ontario, M5S 3G4, Canada.
  • Todorovic P; Department of Electrical and Computer Engineering, University of Toronto, 10 King's College Road, Toronto, Ontario, M5S 3G4, Canada.
  • Sun B; Department of Electrical and Computer Engineering, University of Toronto, 10 King's College Road, Toronto, Ontario, M5S 3G4, Canada.
  • Lee S; Department of Electrical and Computer Engineering, University of Toronto, 10 King's College Road, Toronto, Ontario, M5S 3G4, Canada.
  • Wei M; Department of Electrical and Computer Engineering, University of Toronto, 10 King's College Road, Toronto, Ontario, M5S 3G4, Canada.
  • Li P; Department of Material Science and Engineering, University of Toronto, 184 College St, Toronto, Ontario, M5S 3E4, Canada.
  • Kirmani AR; Materials Science and Engineering Division, National Institute of Standards and Technology (NIST), Gaithersburg, MD, 20899, USA.
  • Sagar LK; Department of Electrical and Computer Engineering, University of Toronto, 10 King's College Road, Toronto, Ontario, M5S 3G4, Canada.
  • Richter LJ; Materials Science and Engineering Division, National Institute of Standards and Technology (NIST), Gaithersburg, MD, 20899, USA.
  • Hoogland S; Department of Electrical and Computer Engineering, University of Toronto, 10 King's College Road, Toronto, Ontario, M5S 3G4, Canada.
  • Lu ZH; Department of Material Science and Engineering, University of Toronto, 184 College St, Toronto, Ontario, M5S 3E4, Canada.
  • García de Arquer FP; Department of Electrical and Computer Engineering, University of Toronto, 10 King's College Road, Toronto, Ontario, M5S 3G4, Canada.
  • Sargent EH; Department of Electrical and Computer Engineering, University of Toronto, 10 King's College Road, Toronto, Ontario, M5S 3G4, Canada.
Adv Mater ; 32(17): e1906199, 2020 Apr.
Article em En | MEDLINE | ID: mdl-32196136

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2020 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2020 Tipo de documento: Article