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An efficient method for indexing grazing-incidence X-ray diffraction data of epitaxially grown thin films.
Simbrunner, Josef; Schrode, Benedikt; Domke, Jari; Fritz, Torsten; Salzmann, Ingo; Resel, Roland.
Afiliação
  • Simbrunner J; Department of Neuroradiology, Vascular and Interventional Radiology, Medical University Graz, Auenbruggerplatz 9, Graz, 8036, Austria.
  • Schrode B; Institute of Solid State Physics, Graz University of Technology, Petersgasse 16, Graz, 8010, Austria.
  • Domke J; Institute of Solid State Physics, Friedrich Schiller University Jena, Helmholtzweg 5, Jena, 07743, Germany.
  • Fritz T; Institute of Solid State Physics, Friedrich Schiller University Jena, Helmholtzweg 5, Jena, 07743, Germany.
  • Salzmann I; Department of Physics, Department of Chemistry and Biochemistry, Centre for Research in Molecular Modeling (CERMM), Centre for NanoScience Research (CeNSR), Concordia University, 7141 Sherbrooke Street W., SP 265-20, Montreal, Québec H4B 1R6, Canada.
  • Resel R; Institute of Solid State Physics, Graz University of Technology, Petersgasse 16, Graz, 8010, Austria.
Acta Crystallogr A Found Adv ; 76(Pt 3): 345-357, 2020 May 01.
Article em En | MEDLINE | ID: mdl-32356785
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Texto completo: 1 Base de dados: MEDLINE Tipo de estudo: Incidence_studies / Risk_factors_studies Idioma: En Ano de publicação: 2020 Tipo de documento: Article
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Base de dados: MEDLINE Tipo de estudo: Incidence_studies / Risk_factors_studies Idioma: En Ano de publicação: 2020 Tipo de documento: Article