Using CËerenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescence.

Using CËerenkov radiation for measuring the refractive index in thick samples by interferometric cathodoluminescence.

Stöger-Pollach, Michael; Löffler, Stefan; Maurer, Niklas; Bukvisová, Kristýna.

Afiliação

Stöger-Pollach M; University Service Center for Transmission Electron Microscopy (USTEM), Technische Universität Wien, Wiedner Hauptstraße 8-10, Wien 1040, Austria; Institute of Solid State Physics, Technische Universität Wien, Wiedner Hauptstraße 8-10, Wien 1040, Austria. Electronic address: stoeger@ustem.tuwien.ac.
Löffler S; University Service Center for Transmission Electron Microscopy (USTEM), Technische Universität Wien, Wiedner Hauptstraße 8-10, Wien 1040, Austria; Institute of Solid State Physics, Technische Universität Wien, Wiedner Hauptstraße 8-10, Wien 1040, Austria.
Maurer N; Institute of Solid State Physics, Technische Universität Wien, Wiedner Hauptstraße 8-10, Wien 1040, Austria.
Bukvisová K; Central European Institute of Technology (CEITEC), Brno University of Technology, Purkynova 123, Brno 612 00, Czech Republic.

Ultramicroscopy ; 214: 113011, 2020 Jul.

Article em En | MEDLINE | ID: mdl-32408181