Quantifying microscale drivers for fatigue failure via coupled synchrotron X-ray characterization and simulations.

Gustafson, Sven; Ludwig, Wolfgang; Shade, Paul; Naragani, Diwakar; Pagan, Darren; Cook, Phil; Yildirim, Can; Detlefs, Carsten; Sangid, Michael D.

Afiliação

Gustafson S; School of Aeronautics and Astronautics, Purdue University, 701W. Stadium Ave, West Lafayette, IN, 47906, USA.
Ludwig W; University Lyon I, MATEIS, UMR5510 CNRS, 25 av. J. Capelle, 69621, Villeurbanne, France.
Shade P; European Synchrotron Radiation Facility, Beamline ID06, 71 Avenue des Martyrs, 38000, Grenoble, France.
Naragani D; Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson AFB, OH, 45433, USA.
Pagan D; School of Aeronautics and Astronautics, Purdue University, 701W. Stadium Ave, West Lafayette, IN, 47906, USA.
Cook P; Cornell High Energy Synchrotron Source, Ithaca, NY, USA.
Yildirim C; European Synchrotron Radiation Facility, Beamline ID06, 71 Avenue des Martyrs, 38000, Grenoble, France.
Detlefs C; European Synchrotron Radiation Facility, Beamline ID06, 71 Avenue des Martyrs, 38000, Grenoble, France.
Sangid MD; LETI, CEA, 17 Avenue des Martyrs, Grenoble, 38054, France.

Nat Commun ; 11(1): 3189, 2020 Jun 24.

Article em En | MEDLINE | ID: mdl-32581264

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2020 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2020 Tipo de documento: Article