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Atomic Layer MoS2xTe2(1-x) Ternary Alloys: Two-Dimensional van der Waals Growth, Band gap Engineering, and Electrical Transport.
Kim, DongHwan; Oh, Guen Hyung; Kim, Ansoon; Shin, ChaeHo; Park, Jonghoo; Kim, Sang-Il; Kim, TaeWan.
Afiliação
  • Kim D; Materials and Convergence Metrology Institute, Korea Research Institute of Standards and Science, Daejeon 34113, South Korea.
  • Oh GH; Department of Electrical Engineering and Smart Grid Research Center, Jeonbuk National University, Jeonju 54896, South Korea.
  • Kim A; Materials and Convergence Metrology Institute, Korea Research Institute of Standards and Science, Daejeon 34113, South Korea.
  • Shin C; Materials and Convergence Metrology Institute, Korea Research Institute of Standards and Science, Daejeon 34113, South Korea.
  • Park J; Department of Electrical Engineering, Kyungpook National University, Daegu 41566, South Korea.
  • Kim SI; Department of Materials Science and Engineering, University of Seoul, 163 Seoulsiripdae-ro, Dongdaemun-gu, Seoul 02504, South Korea.
  • Kim T; Department of Electrical Engineering and Smart Grid Research Center, Jeonbuk National University, Jeonju 54896, South Korea.
ACS Appl Mater Interfaces ; 12(36): 40518-40524, 2020 Sep 09.
Article em En | MEDLINE | ID: mdl-32808524
Ternary alloys in two-dimensional (2D) transition-metal dichalcogenides allow band gap tuning and phase engineering and change the electrical transport type. A process of 2D van der Waals epitaxial growth of molybdenum sulfide telluride alloys (MoS2xTe2(1-x), 0 ≤ x ≤ 1) is presented for synthesizing few-atomic-layer films on SiO2 substrates using metal-organic chemical vapor deposition. Raman spectra, X-ray photoelectron spectra, photoluminescence (PL), and electrical transport properties of few-atomic-layer MoS2xTe2(1-x) (0 ≤ x ≤ 1) films are systematically investigated. The strong PL peaks at 80 K from MoS2xTe2(1-x) (0.45 ≤ x ≤ 0.93) reveal a composition-controllable optical band gap (Eg = 1.55-1.91 eV at 80 K). Electrical transport properties of MoS2xTe2(1-x) alloys, where 0 ≤ x ≤ 0.8 and 0.93 ≤ x ≤ 1, exhibit p-type and n-type semiconducting behaviors, respectively. Remarkably, an increase in the Te composition of a few-atomic-layer MoS2xTe2(1-x) (0 ≤ x ≤ 1) film left-shifts the threshold voltage of a MoS2xTe2(1-x) (0 ≤ x ≤ 1) field-effect transistor. The narrower band gap energies of MoS2xTe2(1-x) films with higher Te content cause a decrease in the on/off current ratios.
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Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2020 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2020 Tipo de documento: Article