Evaluation and application of a new scintillator-based heat-resistant back-scattered electron detector during heat treatment in the scanning electron microscope.

Podor, R; Mendonça, J; Lautru, J; Brau, H P; Nogues, D; Candeias, A; Horodysky, P; Kolouch, A; Barreau, M; Carrier, X; Ramenatte, N; Mathieu, S; Vilasi, M

Podor, R; Mendonça, J; Lautru, J; Brau, H P; Nogues, D; Candeias, A; Horodysky, P; Kolouch, A; Barreau, M; Carrier, X; Ramenatte, N; Mathieu, S; Vilasi, M.

Afiliação

Podor R; ICSM, Univ Montpellier, CNRS, ENSCM, CEA, Bagnols sur Cèze, France.
Mendonça J; ICSM, Univ Montpellier, CNRS, ENSCM, CEA, Bagnols sur Cèze, France.
Lautru J; NewTEC Scientific, Nîmes, France.
Brau HP; ICSM, Univ Montpellier, CNRS, ENSCM, CEA, Bagnols sur Cèze, France.
Nogues D; ICSM, Univ Montpellier, CNRS, ENSCM, CEA, Bagnols sur Cèze, France.
Candeias A; NewTEC Scientific, Nîmes, France.
Horodysky P; NewTEC Scientific, Nîmes, France.
Kolouch A; CRYTUR, spol. s.r.o., Czech Republic.
Barreau M; CRYTUR, spol. s.r.o., Czech Republic.
Carrier X; Laboratoire de Réactivité de Surface, CNRS, Sorbonne Université, Paris, France.
Ramenatte N; Laboratoire de Réactivité de Surface, CNRS, Sorbonne Université, Paris, France.
Mathieu S; CNRS, IJL, Université de Lorraine, Nancy, France.
Vilasi M; CNRS, IJL, Université de Lorraine, Nancy, France.