Application of contact-resonance AFM methods to polymer samples.

Friedrich, Sebastian; Cappella, Brunero

Friedrich, Sebastian; Cappella, Brunero.

Afiliação

Friedrich S; Federal Institute for Material Research and Testing (BAM), Unter den Eichen 87, 12205 Berlin, Germany.
Cappella B; Federal Institute for Material Research and Testing (BAM), Unter den Eichen 87, 12205 Berlin, Germany.

Beilstein J Nanotechnol ; 11: 1714-1727, 2020.

Article em En | MEDLINE | ID: mdl-33224702

Palavras-chave

atomic force microscopy; contact resonance; mechanical properties; polymers; wear

Texto completo

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7670117
https://dx.doi.org/10.3762/bjnano.11.154

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Texto completo: 1 Base de dados: MEDLINE Tipo de estudo: Prognostic_studies Idioma: En Ano de publicação: 2020 Tipo de documento: Article

Texto completo

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7670117
https://dx.doi.org/10.3762/bjnano.11.154

Imprimir

XML

PubMed Links

Buscar no Google

Texto completo: 1 Base de dados: MEDLINE Tipo de estudo: Prognostic_studies Idioma: En Ano de publicação: 2020 Tipo de documento: Article