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New Binary Locally Repairable Codes with Locality 2 and Uneven Availabilities for Hot Data.
Lee, Kang-Seok; Park, Hosung; No, Jong-Seon.
Afiliação
  • Lee KS; Samsung Electronics, Co. Ltd., Hwasung, Gyeonggi-do 18448, Korea.
  • Park H; School of Electronics and Computer Engineering, Chonnam National University, Gwangju 61186, Korea.
  • No JS; Department of Electrical and Computer Engineering, Institute of New Media and Communications, Seoul National University, Seoul 08826, Korea.
Entropy (Basel) ; 20(9)2018 Aug 25.
Article em En | MEDLINE | ID: mdl-33265725

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2018 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2018 Tipo de documento: Article