Differential electron yield imaging with STXM.

Hubbard, William A; Lodico, Jared J; Ling, Xin Yi; Zutter, Brian T; Yu, Young-Sang; Shapiro, David A; Regan, B C.

Afiliação

Hubbard WA; Department of Physics and Astronomy, University of California, Los Angeles, CA 90095, USA; California NanoSystems Institute, University of California, Los Angeles, CA 90095, USA.
Lodico JJ; Department of Physics and Astronomy, University of California, Los Angeles, CA 90095, USA; California NanoSystems Institute, University of California, Los Angeles, CA 90095, USA.
Ling XY; Department of Physics and Astronomy, University of California, Los Angeles, CA 90095, USA; California NanoSystems Institute, University of California, Los Angeles, CA 90095, USA.
Zutter BT; Department of Physics and Astronomy, University of California, Los Angeles, CA 90095, USA; California NanoSystems Institute, University of California, Los Angeles, CA 90095, USA.
Yu YS; Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA.
Shapiro DA; Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA, 94720, USA.
Regan BC; Department of Physics and Astronomy, University of California, Los Angeles, CA 90095, USA; California NanoSystems Institute, University of California, Los Angeles, CA 90095, USA. Electronic address: regan@physics.ucla.edu.

Ultramicroscopy ; 222: 113198, 2021 Mar.

Article em En | MEDLINE | ID: mdl-33482467