4D-STEM of Beam-Sensitive Materials.

Bustillo, Karen C; Zeltmann, Steven E; Chen, Min; Donohue, Jennifer; Ciston, Jim; Ophus, Colin; Minor, Andrew M

Bustillo, Karen C; Zeltmann, Steven E; Chen, Min; Donohue, Jennifer; Ciston, Jim; Ophus, Colin; Minor, Andrew M.

Afiliação

Bustillo KC; National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States.
Zeltmann SE; Department of Materials Science and Engineering, University of California, Berkeley, California 94720, United States.
Chen M; Department of Materials Science and Engineering, University of California, Berkeley, California 94720, United States.
Donohue J; Department of Materials Science and Engineering, University of California, Berkeley, California 94720, United States.
Ciston J; National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States.
Ophus C; National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States.
Minor AM; National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States.

Acc Chem Res ; 54(11): 2543-2551, 2021 Jun 01.

Article em En | MEDLINE | ID: mdl-33979131

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Texto completo: 1 Base de dados: MEDLINE Tipo de estudo: Diagnostic_studies Idioma: En Ano de publicação: 2021 Tipo de documento: Article

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Texto completo: 1 Base de dados: MEDLINE Tipo de estudo: Diagnostic_studies Idioma: En Ano de publicação: 2021 Tipo de documento: Article