Correction of artefacts associated with large area EBSD.

Winiarski, B; Gholinia, A; Mingard, K; Gee, M; Thompson, G; Withers, P J

Winiarski, B; Gholinia, A; Mingard, K; Gee, M; Thompson, G; Withers, P J.

Afiliação

Winiarski B; Department of Materials, University of Manchester, Manchester, M13 9PL, United Kingdom; Thermo Fisher Scientific, 62700 Brno, Czech Republic.
Gholinia A; Department of Materials, University of Manchester, Manchester, M13 9PL, United Kingdom; Henry Royce Institute, Department of Materials, University of Manchester, Manchester, M13 9PL, United Kingdom. Electronic address: ali.gholinia@manchester.ac.uk.
Mingard K; Materials Division, National Physical Laboratory, Teddington, TW11 0LW, United Kingdom.
Gee M; Materials Division, National Physical Laboratory, Teddington, TW11 0LW, United Kingdom.
Thompson G; Department of Materials, University of Manchester, Manchester, M13 9PL, United Kingdom.
Withers PJ; Department of Materials, University of Manchester, Manchester, M13 9PL, United Kingdom; Henry Royce Institute, Department of Materials, University of Manchester, Manchester, M13 9PL, United Kingdom.

Ultramicroscopy ; 226: 113315, 2021 Jul.

Article em En | MEDLINE | ID: mdl-34049196

Palavras-chave

Broad ion beam polishing; Cermet; Computed tomography (CT); Serial block face sectioning electron microscopy (SBFSEM); electron back scatter diffraction; focused ion beam (FIB)

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Texto completo: 1 Base de dados: MEDLINE Tipo de estudo: Risk_factors_studies Idioma: En Ano de publicação: 2021 Tipo de documento: Article

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Texto completo: 1 Base de dados: MEDLINE Tipo de estudo: Risk_factors_studies Idioma: En Ano de publicação: 2021 Tipo de documento: Article