Using TOF-SIMS Spectrometry to Study the Kinetics of the Interfacial Retro Diels-Alder Reaction.

Hassouna, Lilia; Enganati, Sachin Kumar; Bally-Le Gall, Florence; Mertz, Grégory; Bour, Jérôme; Ruch, David; Roucoules, Vincent.

Afiliação

Hassouna L; Materials and Research Technology Department, Luxembourg Institute of Science and Technology, 5 Avenue des Hauts-Fourneaux, L-4362 Esch-sur-Alzette, Luxembourg.
Enganati SK; Department of Physics and Materials Science, University of Luxembourg, 2 Avenue de l'Université, L-4365 Esch-sur-Alzette, Luxembourg.
Bally-Le Gall F; Materials and Research Technology Department, Luxembourg Institute of Science and Technology, 5 Avenue des Hauts-Fourneaux, L-4362 Esch-sur-Alzette, Luxembourg.
Mertz G; Department of Physics and Materials Science, University of Luxembourg, 2 Avenue de l'Université, L-4365 Esch-sur-Alzette, Luxembourg.
Bour J; University of Haute-Alsace, University of Strasbourg, CNRS, IS2M UMR 7361, F-68100 Mulhouse, France.
Ruch D; Materials and Research Technology Department, Luxembourg Institute of Science and Technology, 5 Avenue des Hauts-Fourneaux, L-4362 Esch-sur-Alzette, Luxembourg.
Roucoules V; Materials and Research Technology Department, Luxembourg Institute of Science and Technology, 5 Avenue des Hauts-Fourneaux, L-4362 Esch-sur-Alzette, Luxembourg.

Materials (Basel) ; 14(10)2021 May 20.

Article em En | MEDLINE | ID: mdl-34065263