High-resolution compositional mapping of surfaces in non-contact atomic force microscopy by a new multi-frequency excitation. | Ultramicroscopy;227: 113317, 2021 Aug. | MEDLINE

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High-resolution compositional mapping of surfaces in non-contact atomic force microscopy by a new multi-frequency excitation.

Ghanbari Kouchaksaraei, Mostafa; Bahrami, Arash.

Afiliação

Ghanbari Kouchaksaraei M; School of Mechanical Engineering, College of Engineering, University of Tehran, Tehran, Iran.
Bahrami A; School of Mechanical Engineering, College of Engineering, University of Tehran, Tehran, Iran. Electronic address: arash.bahrami@ut.ac.ir.

Ultramicroscopy ; 227: 113317, 2021 Aug.

Article em En | MEDLINE | ID: mdl-34119854

Palavras-chave

Atomic force microscopy; Combination resonance; Hamaker constant; Multi-frequency excitation; Vertical resolution

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Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2021 Tipo de documento: Article

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Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2021 Tipo de documento: Article