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Passivation of the Buried Interface via Preferential Crystallization of 2D Perovskite on Metal Oxide Transport Layers.
Chen, Bin; Chen, Hao; Hou, Yi; Xu, Jian; Teale, Sam; Bertens, Koen; Chen, Haijie; Proppe, Andrew; Zhou, Qilin; Yu, Danni; Xu, Kaimin; Vafaie, Maral; Liu, Yuan; Dong, Yitong; Jung, Eui Hyuk; Zheng, Chao; Zhu, Tong; Ning, Zhijun; Sargent, Edward H.
Afiliação
  • Chen B; Department of Electrical and Computer Engineering, University of Toronto, 35 St George Street, Toronto, Ontario, M5S 1A4, Canada.
  • Chen H; Department of Electrical and Computer Engineering, University of Toronto, 35 St George Street, Toronto, Ontario, M5S 1A4, Canada.
  • Hou Y; School of Physical Science and Technology, ShanghaiTech University, Shanghai, 201210, China.
  • Xu J; Department of Electrical and Computer Engineering, University of Toronto, 35 St George Street, Toronto, Ontario, M5S 1A4, Canada.
  • Teale S; Department of Electrical and Computer Engineering, University of Toronto, 35 St George Street, Toronto, Ontario, M5S 1A4, Canada.
  • Bertens K; Department of Electrical and Computer Engineering, University of Toronto, 35 St George Street, Toronto, Ontario, M5S 1A4, Canada.
  • Chen H; Department of Electrical and Computer Engineering, University of Toronto, 35 St George Street, Toronto, Ontario, M5S 1A4, Canada.
  • Proppe A; Department of Electrical and Computer Engineering, University of Toronto, 35 St George Street, Toronto, Ontario, M5S 1A4, Canada.
  • Zhou Q; Department of Electrical and Computer Engineering, University of Toronto, 35 St George Street, Toronto, Ontario, M5S 1A4, Canada.
  • Yu D; School of Physical Science and Technology, ShanghaiTech University, Shanghai, 201210, China.
  • Xu K; School of Physical Science and Technology, ShanghaiTech University, Shanghai, 201210, China.
  • Vafaie M; School of Physical Science and Technology, ShanghaiTech University, Shanghai, 201210, China.
  • Liu Y; Department of Electrical and Computer Engineering, University of Toronto, 35 St George Street, Toronto, Ontario, M5S 1A4, Canada.
  • Dong Y; Department of Electrical and Computer Engineering, University of Toronto, 35 St George Street, Toronto, Ontario, M5S 1A4, Canada.
  • Jung EH; Department of Electrical and Computer Engineering, University of Toronto, 35 St George Street, Toronto, Ontario, M5S 1A4, Canada.
  • Zheng C; Department of Electrical and Computer Engineering, University of Toronto, 35 St George Street, Toronto, Ontario, M5S 1A4, Canada.
  • Zhu T; Department of Electrical and Computer Engineering, University of Toronto, 35 St George Street, Toronto, Ontario, M5S 1A4, Canada.
  • Ning Z; Department of Electrical and Computer Engineering, University of Toronto, 35 St George Street, Toronto, Ontario, M5S 1A4, Canada.
  • Sargent EH; School of Physical Science and Technology, ShanghaiTech University, Shanghai, 201210, China.
Adv Mater ; 33(41): e2103394, 2021 Oct.
Article em En | MEDLINE | ID: mdl-34425038

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2021 Tipo de documento: Article

Texto completo: 1 Base de dados: MEDLINE Idioma: En Ano de publicação: 2021 Tipo de documento: Article