Investigation of the Impact of Neutron Irradiation on SiC Power MOSFETs Lifetime by Reliability Tests.

Principato, Fabio; Allegra, Giuseppe; Cappello, Corrado; Crepel, Olivier; Nicosia, Nicola; D Arrigo, Salvatore; Cantarella, Vincenzo; Di Mauro, Alessandro; Abbene, Leonardo; Mirabello, Marcello; Pintacuda, Francesco.

Afiliação

Principato F; Department of Physics and Chemistry-Emilio Segrè (DiFC), Palermo University, Viale Delle Scienze, Ed. 18, 90128 Palermo, Italy.
Allegra G; STMicroelectronics, Stradale Primosole 50, 95121 Catania, Italy.
Cappello C; STMicroelectronics, Stradale Primosole 50, 95121 Catania, Italy.
Crepel O; Central Airbus R&T, LDC Airbus SAS, Oliver Crepel E177, 14 rue Gabriel Clerc, CEDEX, 31707 Blagnac, France.
Nicosia N; STMicroelectronics, Stradale Primosole 50, 95121 Catania, Italy.
D Arrigo S; STMicroelectronics, Stradale Primosole 50, 95121 Catania, Italy.
Cantarella V; STMicroelectronics, Stradale Primosole 50, 95121 Catania, Italy.
Di Mauro A; STMicroelectronics, Stradale Primosole 50, 95121 Catania, Italy.
Abbene L; Department of Physics and Chemistry-Emilio Segrè (DiFC), Palermo University, Viale Delle Scienze, Ed. 18, 90128 Palermo, Italy.
Mirabello M; Department of Physics and Chemistry-Emilio Segrè (DiFC), Palermo University, Viale Delle Scienze, Ed. 18, 90128 Palermo, Italy.
Pintacuda F; STMicroelectronics, Stradale Primosole 50, 95121 Catania, Italy.