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Oxygen Concentration Effect on Conductive Bridge Random Access Memory of InWZnO Thin Film.
Hsu, Chih-Chieh; Liu, Po-Tsun; Gan, Kai-Jhih; Ruan, Dun-Bao; Sze, Simon M.
Afiliação
  • Hsu CC; Department of Electronics Engineering, National Yang Ming Chiao Tung University, Hsinchu 30010, Taiwan.
  • Liu PT; Department of Photonics and Institute of Electro-Optical Engineering, National Yang Ming Chiao Tung University, Hsinchu 30010, Taiwan.
  • Gan KJ; Department of Electronics Engineering, National Yang Ming Chiao Tung University, Hsinchu 30010, Taiwan.
  • Ruan DB; Department of Electronics Engineering, National Yang Ming Chiao Tung University, Hsinchu 30010, Taiwan.
  • Sze SM; Department of Electronics Engineering, National Yang Ming Chiao Tung University, Hsinchu 30010, Taiwan.
Nanomaterials (Basel) ; 11(9)2021 Aug 27.
Article em En | MEDLINE | ID: mdl-34578520
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Texto completo: 1 Base de dados: MEDLINE Tipo de estudo: Clinical_trials Idioma: En Ano de publicação: 2021 Tipo de documento: Article
Texto completo
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XML
PubMed Links
Buscar no Google

Texto completo: 1 Base de dados: MEDLINE Tipo de estudo: Clinical_trials Idioma: En Ano de publicação: 2021 Tipo de documento: Article