Completion of Metal-Damaged Traces Based on Deep Learning in Sinogram Domain for Metal Artifacts Reduction in CT Images.

Zhu, Linlin; Han, Yu; Xi, Xiaoqi; Li, Lei; Yan, Bin.

Afiliação

Zhu L; Henan Key Laboratory of Imaging and Intelligent Processing, PLA Strategic Support Force Information Engineering University, Zhengzhou 450001, China.
Han Y; Henan Key Laboratory of Imaging and Intelligent Processing, PLA Strategic Support Force Information Engineering University, Zhengzhou 450001, China.
Xi X; Henan Key Laboratory of Imaging and Intelligent Processing, PLA Strategic Support Force Information Engineering University, Zhengzhou 450001, China.
Li L; Henan Key Laboratory of Imaging and Intelligent Processing, PLA Strategic Support Force Information Engineering University, Zhengzhou 450001, China.
Yan B; Henan Key Laboratory of Imaging and Intelligent Processing, PLA Strategic Support Force Information Engineering University, Zhengzhou 450001, China.

Sensors (Basel) ; 21(24)2021 Dec 07.

Article em En | MEDLINE | ID: mdl-34960258